Ion Track Technology

PhysicsConsult

Reimar Spohr

PostHeaderIcon Abstract

Photoionization Mass Spectrometric Study of XeF2, XeF4, and XeF6. J. Berkowitz, W.A. Chupka, P.M. Guyon, J.H. Holloway, R. Spohr. J. Phys. Chem. 75(1971)1461 - 1471.

Abstract