Ion Track Technology

PhysicsConsult

Reimar Spohr

PostHeaderIcon Abstract

Sample inlet system for ion beam treatments (in German). E. Malwitz, K. Illert, R. Spohr. German Patent Registration DE 2835711 C2, (1978)

The inlet system transfers objects from atmospheric conditions into the vacuum system where the samples are exposed to an arbitrary form of treatment, such as irradiating the samples with swift heavy ions. The arbitrarily shaped sample inlet system uses capsules adapting the objects to the inlet system. The capsules are passed one-by-one from atmospheric conditions into the vacuum system, thereby passing through differential pumping stages (dynamic vacuum seals) into the vacuum system and back into atmosphere.